X-ray Orientation Units to Test The Orientation of Sapphire Single Crystal

• After-sales Service: 7*24hours
• Portable: Non Portable
• Form: Flatbed
• Model NO.: FW-INSTRUMRNTS
• Application: Industrial
• Type: Industrial High-definition X-ray Detector
• Certification: ISO
• Customized: Customized
• Application1: Semiconductor Manufacturing
• Key Components: X-ray Goniometer
• Transport Package: Wood
• Trademark: FineWin
• Origin: China

Product Description

Product Description

what is X-Ray Orientation Unit & Application

A Semiconductor Mono-Crystal X-Ray Orientation Unit is a specialized instrument used to determine the precise crystallographic orientation of single-crystal semiconductor wafers, typically silicon, germanium, or gallium arsenide. This is crucial because the crystal orientation significantly impacts the properties and performance of semiconductor devices. The unit utilizes X-ray diffraction techniques to analyze the crystal structure and determine the orientation with high accuracy, often within a few angular seconds. 

Applications:
Semiconductor Manufacturing:
Ensuring proper crystal orientation is critical for fabricating high-performance transistors, diodes, and other semiconductor components.  
Material Science Research:
Studying the relationship between crystal orientation and material properties.  
Quality Control:
Verifying the orientation of wafers during production to ensure consistency and quality.  
Research and Development:
Exploring new materials and processes that rely on specific crystal orientations.  
 

DXL-C8BD(600AG/800AG Serial) I n g o t  O r i e n t a t i o n  B e f o r e  P r o c e s s i n g

This Equipment cooperates wi th special fixtures to complete the or ientat ion of large- sized crystal balls/crystal ingots before processing. Common include: (1)Or ient the crystal ingot before digging out . (commonly found in sapphire crystal ingots) (2)Or ientat ion before square root . (commonly found in sapphire crystal ingots) (3)Or ient before digging out the seed crystal. (commonly found in silicon single crystal ingots)

Equipment Pertormance

• Supports multi-angle orientation.(θ:0~50°)

• Automatic positioning of X-ray focus height.

• The equipment is equipped with a rotating worktable, which allows the crystal under test to rotate and orient 360°.

• Calibration-free, no need for daily equipment calibration.

• Selective touch screen operation simplifies input conditions and reduces misoperation rates.

• The crystal after end face grinding can also be re-inspected.

Specification

Item	Specifications(8BD600AG)	Specifications(8BD800AG)
Crystal Specifications	Crystal Balls/ ingots up to 200kg	Crystal Balls/ ingots up to 450kg
Measuring space (with fixtures and crystals)	MAX:600(Inches)X500(High)mm	largest:800(Inches)X750(High)mm
Measurement angle	0~50°	0~50°
Accuracy	±30″	±30″